Figure 9: Approaching zero (AFM images of ÒcrackingÓ)
(A) Atomic Force Microscopy image of a crack in Si. (B) AFM image of a PDMS replica of the same crack. (C) AFM image of a PU replica produced with the PDMS mold. (D) Line-scan cross-sections of Si, PDMS, and PU at the locations indicated by dashed lines in A-C.