Citation:
C. M. Bowers, K. C. Liao, T. Zaba, D. Rappoport, M. Baghbanzadeh, B. Breiten, A. Krzykawska, P. Cyganik, and G. M. Whitesides. 2015. “Characterizing the Metal-SAM Interface in Tunneling Junctions.” ACS Nano, 9, Pp. 1471-1477.
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