The Structure of Self-Assembled Monolayers of Alkylsiloxanes on Silicon: A Comparison of Results from Ellipsometry and Low-Angle X-Ray Reflectivity

Citation:

S. R. Wasserman, G. M. Whitesides, I. M. Tidswell, B. M. Ocko, P. S. Pershan, and J. D. Axe. 1989. “The Structure of Self-Assembled Monolayers of Alkylsiloxanes on Silicon: A Comparison of Results from Ellipsometry and Low-Angle X-Ray Reflectivity.” J. Am. Chem. Soc., 111, Pp. 5852-5861.
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Last updated on 09/26/2018