Citation:
J. R. Barber, H. J. Yoon, C. M. Bowers, M. M. Thuo, B. Breiten, D. M. Gooding, and G. M. Whitesides. 2014. “The Influence of Environment on the Measurement of Rates of Charge Transport across AgTS/SAM//Ga2O3/EGaIn Junctions.” Chemistry of Materials, 26, Pp. 3938-3947.
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