Citation:
F. C. Simeone, H. J. Yoon, M. M. Thuo, J. R. Barber, B. S. Smith, and G. M. Whitesides. 2013. “Defining the Value of Injection Current and Effective Electrical Contact Area for EGaIn-Based Molecular Tunneling Junctions.” J. Amer. Chem. Soc., 135, Pp. 18131-18144.
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